Comparing Xe+ pFIB and Ga+ FIB for TEM sample preparation of Al alloys: Minimising FIB-induced artefacts. (2021)
Attributed to:
Sir Henry Royce InsStitute - recurrent grant
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1111/jmi.12983
PubMed Identifier: 33210738
Publication URI: http://europepmc.org/abstract/MED/33210738
Type: Journal Article/Review
Volume: 282
Parent Publication: Journal of microscopy
Issue: 2
ISSN: 0022-2720