On the Correlation between Light-Induced Degradation and Minority Carrier Traps in Boron-Doped Czochralski Silicon (2021)
Attributed to:
Light and Elevated Temperature Induced Degradation of Silicon Solar Cells
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1021/acsami.0c17549
PubMed Identifier: 33497179
Publication URI: http://europepmc.org/abstract/MED/33497179
Type: Journal Article/Review
Parent Publication: ACS Applied Materials & Interfaces
Issue: 5
ISSN: 1944-8244