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On the Correlation between Light-Induced Degradation and Minority Carrier Traps in Boron-Doped Czochralski Silicon. (2021)

First Author: Jafari S

Attributed to: Light and Elevated Temperature Induced Degradation of Silicon Solar Cells funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/acsami.0c17549

PubMed Identifier: 33497179

Publication URI: http://europepmc.org/abstract/MED/33497179

Type: Journal Article/Review

Volume: 13

Parent Publication: ACS applied materials & interfaces

Issue: 5

ISSN: 1944-8244