Non-destructive imaging for quality assurance of magnetoresistive random-access memory junctions (2019)

First Author: Jackson E
Attributed to:  Spintronic Devices for Integrated Logic Circuits funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1361-6463/ab47b6

Publication URI: http://dx.doi.org/10.1088/1361-6463/ab47b6

Type: Journal Article/Review

Parent Publication: Journal of Physics D: Applied Physics

Issue: 1

ISSN: 13616463 00223727