Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part II: Post-Acquisition Data Processing, Visualization, and Structural Characterization. (2020)

First Author: Paterson GW

Attributed to: Fast Pixel Detectors: a paradigm shift in STEM imaging funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1017/s1431927620024307

PubMed Identifier: 32883393

Publication URI: http://europepmc.org/abstract/MED/32883393

Type: Journal Article/Review

Volume: 26

Parent Publication: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

Issue: 5

ISSN: 1431-9276