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Tensegrity Modelling and the High Toughness of Spider Dragline Silk. (2020)

First Author: Fraternali F

Attributed to: SEE MORE: SECONDARY ELECTRON EMISSION - MICROSCOPY FOR ORGANICS WITH RELIABLE ENGINEERING-PROPERTIES funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.3390/nano10081510

PubMed Identifier: 32752054

Publication URI: http://europepmc.org/abstract/MED/32752054

Type: Journal Article/Review

Volume: 10

Parent Publication: Nanomaterials (Basel, Switzerland)

Issue: 8

ISSN: 2079-4991