Noncontact Thickness Measurement of Multilayer Coatings on Metallic Substrate Using Pulsed Terahertz Technology (2020)
Attributed to:
Novel Sensing Networks for Intelligent Monitoring (Newton)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/jsen.2019.2958674
Publication URI: http://dx.doi.org/10.1109/jsen.2019.2958674
Type: Journal Article/Review
Parent Publication: IEEE Sensors Journal
Issue: 6