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An Investigation of Gate Voltage Oscillation and its Suppression for SiC MOSFET (2020)

First Author: Zhang W

Attributed to: Reliability, Condition Monitoring and Health Management Technologies for WBG Power Modules funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/access.2020.3008940

Publication URI: http://dx.doi.org/10.1109/access.2020.3008940

Type: Journal Article/Review

Parent Publication: IEEE Access