Characterisation of negative- U defects in semiconductors (2020)

First Author: Coutinho J

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1361-648x/ab8091

PubMed Identifier: 32182607

Publication URI: http://europepmc.org/abstract/MED/32182607

Type: Journal Article/Review

Parent Publication: Journal of Physics: Condensed Matter

Issue: 32

ISSN: 0953-8984