In-Process Fast Surface Measurement Using Wavelength Scanning Interferometry (2012)

First Author: Gao F
Attributed to:  EPSRC Centre for Innovative Manufacturing in Advanced Metrology funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.4028/www.scientific.net/amr.622-623.357

Publication URI: http://dx.doi.org/10.4028/www.scientific.net/amr.622-623.357

Type: Journal Article/Review

Parent Publication: Advanced Materials Research