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Analysis of switching, degradation and failure mechanisms by RTN signals in non-filamentary (a-VMCO) RRAM devices (2018)

First Author: Zhang W

Attributed to: Variability-aware RRAM PDK for design based research on FPGA/neuro computing funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/icsict.2018.8565748

Publication URI: http://dx.doi.org/10.1109/icsict.2018.8565748

Type: Conference/Paper/Proceeding/Abstract