Nanoscale imaging of mobile carriers and trapped charges in delta doped silicon p-n junctions (2020)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1038/s41928-020-0450-8

Publication URI: http://dx.doi.org/10.1038/s41928-020-0450-8

Type: Journal Article/Review

Parent Publication: Nature Electronics

Issue: 9