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Novel focused ion beam in-situ methods for stressed and cracked TEM sample preparation

First Author: Zhong X

Attributed to: Modeling and Validation of Irradiation Damage in Ni-based Alloys for Long-Term LWR Applications (US/UK) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/9783527808465.emc2016.6963

Publication URI: http://dx.doi.org/10.1002/9783527808465.emc2016.6963

Type: Book Chapter

Book Title: European Microscopy Congress 2016: Proceedings (2016)

Page Reference: 487-488