Novel focused ion beam in-situ methods for stressed and cracked TEM sample preparation
Attributed to:
Modeling and Validation of Irradiation Damage in Ni-based Alloys for Long-Term LWR Applications (US/UK)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1002/9783527808465.emc2016.6963
Publication URI: http://dx.doi.org/10.1002/9783527808465.emc2016.6963
Type: Book Chapter
Book Title: European Microscopy Congress 2016: Proceedings (2016)
Page Reference: 487-488