Measurement of swelling-induced residual stress in ion implanted SiC, and its effect on micromechanical properties (2020)
Abstract
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Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.actamat.2020.06.030
Publication URI: http://dx.doi.org/10.1016/j.actamat.2020.06.030
Type: Journal Article/Review
Parent Publication: Acta Materialia