Measurement of swelling-induced residual stress in ion implanted SiC, and its effect on micromechanical properties (2020)

First Author: Leide A

Attributed to: Advanced Nuclear Materials funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.actamat.2020.06.030

Publication URI: http://dx.doi.org/10.1016/j.actamat.2020.06.030

Type: Journal Article/Review

Parent Publication: Acta Materialia