An in-situ approach for preparing atom probe tomography specimens by xenon plasma-focussed ion beam. (2019)
Attributed to:
University of Oxford - Equipment Account
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.ultramic.2019.04.005
PubMed Identifier: 31005819
Publication URI: http://europepmc.org/abstract/MED/31005819
Type: Journal Article/Review
Volume: 202
Parent Publication: Ultramicroscopy
ISSN: 0304-3991