Analysis of complex, beam-sensitive materials by transmission electron microscopy and associated techniques. (2020)

First Author: Ilett M
Attributed to:  The Leeds EPSRC Nanoscience and Nanoequipment User Facility funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1098/rsta.2019.0601

PubMed Identifier: 33100161

Publication URI: http://europepmc.org/abstract/MED/33100161

Type: Journal Article/Review

Volume: 378

Parent Publication: Philosophical transactions. Series A, Mathematical, physical, and engineering sciences

Issue: 2186

ISSN: 1364-503X