Analysis of complex, beam-sensitive materials by transmission electron microscopy and associated techniques. (2020)

First Author: Ilett M


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Bibliographic Information

Digital Object Identifier:

PubMed Identifier: 33100161

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Type: Journal Article/Review

Volume: 378

Parent Publication: Philosophical transactions. Series A, Mathematical, physical, and engineering sciences

Issue: 2186

ISSN: 1364-503X