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An Outline of a Complementary Inspection System for Micro-Electro-Mechanical System (MEMS) Devices Based on Radiography and Plenoptic Camera (2018)

First Author: Alvin Yung Boon Chong

Attributed to: QualiNet - Automated in- line inspection and quality control of net shape powder metallurgy components... funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Publication URI: http://ebooks.iospress.nl/publication/50075

Type: Conference/Paper/Proceeding/Abstract