IR hot carrier based photodetection in titanium nitride oxide thin film-Si junctions (2020)
Attributed to:
REACTIVE PLASMONICS: OPTICAL CONTROL OF ELECTRONIC PROCESSES AT INTERFACES FOR NANOSCALE PHYSICS, CHEMISTRY AND METROLOGY
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1557/adv.2020.129
Publication URI: http://dx.doi.org/10.1557/adv.2020.129
Type: Journal Article/Review
Parent Publication: MRS Advances
Issue: 35-36