High-accuracy simultaneous measurement of surface profile and film thickness using line-field white-light dispersive interferometer (2021)
Attributed to:
Future Advanced Metrology Hub
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.optlaseng.2020.106388
Publication URI: http://dx.doi.org/10.1016/j.optlaseng.2020.106388
Type: Journal Article/Review
Parent Publication: Optics and Lasers in Engineering