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Optimizing X-Ray Computed Tomography Settings for Dimensional Metrology Using 2D Image Analysis

First Author: Chahid Y

Attributed to: Future Advanced Metrology Hub funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1520/stp163120190141

Publication URI: http://dx.doi.org/10.1520/stp163120190141

Type: Book Chapter

Book Title: Structural Integrity of Additive Manufactured Materials and Parts (2020)

Page Reference: 88-101