Optimizing X-Ray Computed Tomography Settings for Dimensional Metrology Using 2D Image Analysis
Attributed to:
Future Advanced Metrology Hub
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1520/stp163120190141
Publication URI: http://dx.doi.org/10.1520/stp163120190141
Type: Book Chapter
Book Title: Structural Integrity of Additive Manufactured Materials & Parts (2020)
Page Reference: 88-101