Advanced data analysis procedure for hard x-ray resonant magnetic reflectivity discussed for Pt thin film samples of various complexity (2020)

First Author: Krieft J
Attributed to:  XMaS: The UK Materials Science Facility at the ESRF funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1361-6463/ab8fdc

Publication URI: http://dx.doi.org/10.1088/1361-6463/ab8fdc

Type: Journal Article/Review

Parent Publication: Journal of Physics D: Applied Physics

Issue: 37