📣 Help Shape the Future of UKRI's Gateway to Research (GtR)

We're improving UKRI's Gateway to Research and are seeking your input! If you would be interested in being interviewed about the improvements we're making and to have your say about how we can make GtR more user-friendly, impactful, and effective for the Research and Innovation community, please email gateway@ukri.org.

Atom Probe Tomography Study of Gettering in High-Performance Multicrystalline Silicon (2020)

First Author: Tweddle D

Attributed to: Strategic Equipment - a Dual Beam FIB/SEM with large area patterning, EBSD and nanoprobe capabilities funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/jphotov.2020.2974795

Publication URI: http://dx.doi.org/10.1109/jphotov.2020.2974795

Type: Journal Article/Review

Parent Publication: IEEE Journal of Photovoltaics

Issue: 3