📣 Try out the NEW Gateway to Research and let us know what you think.

We're looking for users to test the new service during August and September and share their feedback. Express your interest by completing this short form.

Focused-probe STEM Ptychography: Developments and Opportunities (2020)

First Author: O'Leary C

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1017/s1431927620014762

Publication URI: http://dx.doi.org/10.1017/s1431927620014762

Type: Journal Article/Review

Parent Publication: Microscopy and Microanalysis

Issue: S2