Coupled Broad Ion Beam-Scanning Electron Microscopy (BIB-SEM) for polishing and three dimensional (3D) serial section tomography (SST). (2020)
Attributed to:
Sir Henry Royce Institute - Manchester and NNL Equipment
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.ultramic.2020.112989
PubMed Identifier: 32416435
Publication URI: http://europepmc.org/abstract/MED/32416435
Type: Journal Article/Review
Volume: 214
Parent Publication: Ultramicroscopy
ISSN: 0304-3991