Coupled Broad Ion Beam-Scanning Electron Microscopy (BIB-SEM) for polishing and three dimensional (3D) serial section tomography (SST). (2020)

First Author: Gholinia A

Attributed to: The Royce: Capitalising on the investment funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.ultramic.2020.112989

PubMed Identifier: 32416435

Publication URI: http://europepmc.org/abstract/MED/32416435

Type: Journal Article/Review

Volume: 214

Parent Publication: Ultramicroscopy

ISSN: 0304-3991