Comparison of interfacial and critical current behaviour of Al+Al2O3 sheathed MgB2 wires with Ta and Ti diffusion barriers (2019)

First Author: Santra S

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.jallcom.2019.151665

Publication URI: http://dx.doi.org/10.1016/j.jallcom.2019.151665

Type: Journal Article/Review

Parent Publication: Journal of Alloys and Compounds