Analysis of GaN Converter Circuit Stability Influenced by Current Collapse Effect (2020)

First Author: Videt A
Attributed to:  Multi-Domain Virtual Prototyping Techniques for Wide-Bandgap Power Electronics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/apec39645.2020.9124351

Publication URI: http://dx.doi.org/10.1109/apec39645.2020.9124351

Type: Conference/Paper/Proceeding/Abstract