Resistive switching behavior of solution-processed AlOx and GO based RRAM at low temperature (2020)
Abstract
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Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.sse.2019.107735
Publication URI: http://dx.doi.org/10.1016/j.sse.2019.107735
Type: Journal Article/Review
Parent Publication: Solid-State Electronics