Al/GO/Si/ Al RRAM with Solution-processed GO dielectric at Low Fabrication Temperature (2019)
Attributed to:
Mechanisms and Control of Resistive Switching in Dielectrics
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/eurosoi-ulis45800.2019.9041877
Publication URI: http://dx.doi.org/10.1109/eurosoi-ulis45800.2019.9041877
Type: Conference/Paper/Proceeding/Abstract