Surface scattering and the 3D transfer characteristics of optical profilers (2020)
Attributed to:
Synthetic aperture interferometry: High-resolution optical measurement over an exceptionally large field of view
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1117/12.2556878
Publication URI: http://dx.doi.org/10.1117/12.2556878
Type: Conference/Paper/Proceeding/Abstract