Gaussian distribution of inhomogeneous nickel-vanadium Schottky interface on silicon (100) (2020)

First Author: Soltani S

Attributed to: Underpinning Power Electronics 2012: Hub funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1361-6641/abc922

Publication URI: http://dx.doi.org/10.1088/1361-6641/abc922

Type: Journal Article/Review

Parent Publication: Semiconductor Science and Technology

Issue: 1