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An in situ exploration of subsurface defect migration to a liquid water-exposed rutile TiO 2 (110) surface by XPS (2020)

First Author: Ahmed M

Attributed to: Ultra-fast interfacial charge transfer probed using a core-hole clock implementation of resonant inelastic x-ray scattering (RIXS) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/sia.6906

Publication URI: http://dx.doi.org/10.1002/sia.6906

Type: Journal Article/Review

Parent Publication: Surface and Interface Analysis

Issue: 12