An in situ exploration of subsurface defect migration to a liquid water-exposed rutile TiO 2 (110) surface by XPS (2020)
Abstract
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Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1002/sia.6906
Publication URI: http://dx.doi.org/10.1002/sia.6906
Type: Journal Article/Review
Parent Publication: Surface and Interface Analysis
Issue: 12