Inelastic background modelling applied to hard X-ray photoelectron spectroscopy of deeply buried layers: A comparison of synchrotron and lab-based (9.25 keV) measurements (2021)
Attributed to:
Sir Henry Royce InsStitute - recurrent grant
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.apsusc.2020.148635
Publication URI: http://dx.doi.org/10.1016/j.apsusc.2020.148635
Type: Journal Article/Review
Parent Publication: Applied Surface Science