Inelastic background modelling applied to hard X-ray photoelectron spectroscopy of deeply buried layers: A comparison of synchrotron and lab-based (9.25 keV) measurements (2021)

First Author: Spencer B
Attributed to:  Sir Henry Royce InsStitute - recurrent grant funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.apsusc.2020.148635

Publication URI: http://dx.doi.org/10.1016/j.apsusc.2020.148635

Type: Journal Article/Review

Parent Publication: Applied Surface Science