Drain bias effects on statistical variability and reliability and related subthreshold variability in 20-nm bulk planar MOSFETs (2014)

First Author: Wang X
Attributed to:  PAnDA: Programmable Analogue and Digital Array funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.sse.2014.04.017

Publication URI: http://dx.doi.org/10.1016/j.sse.2014.04.017

Type: Journal Article/Review

Parent Publication: Solid-State Electronics