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Statistical Enhancement of the Evaluation of Combined RDD- and LER-Induced $V_{T}$ Variability: Lessons From $\hbox{10}^{5}$ Sample Simulations (2011)

First Author: Reid D

Attributed to: PAnDA: Programmable Analogue and Digital Array funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ted.2011.2147317

Publication URI: http://dx.doi.org/10.1109/ted.2011.2147317

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Electron Devices

Issue: 8