Statistical Enhancement of the Evaluation of Combined RDD- and LER-Induced $V_{T}$ Variability: Lessons From $\hbox{10}^{5}$ Sample Simulations (2011)
Attributed to:
PAnDA: Programmable Analogue and Digital Array
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/ted.2011.2147317
Publication URI: http://dx.doi.org/10.1109/ted.2011.2147317
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Electron Devices
Issue: 8