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Visualization of defects in nitride semiconductors by electron channeling (Conference Presentation) (2020)

First Author: Trager-Cowan C

Attributed to: Quantitative non-destructive nanoscale characterisation of advanced materials funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1117/12.2544228

Publication URI: http://dx.doi.org/10.1117/12.2544228

Type: Conference/Paper/Proceeding/Abstract