Pragmatic Micrometre to Millimetre Calibration Using Multiple Methods for Low-Coherence Interferometer in Embedded Metrology Applications. (2021)
Attributed to:
EPSRC Fellowship in Manufacturing: Collaborative Metrology Systems for High Value Manufacturing
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.3390/s21155101
PubMed Identifier: 34372336
Publication URI: http://europepmc.org/abstract/MED/34372336
Type: Journal Article/Review
Volume: 21
Parent Publication: Sensors (Basel, Switzerland)
Issue: 15
ISSN: 1424-8220