Analysis of Tilt Effect on Notch Depth Profiling Using Thin-Skin Regime of Driver-Pickup Eddy-Current Sensor. (2021)

First Author: Lu M
Attributed to:  Real-time In-line Microstructural Engineering (RIME) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.3390/s21165536

PubMed Identifier: 34450979

Publication URI: http://europepmc.org/abstract/MED/34450979

Type: Journal Article/Review

Volume: 21

Parent Publication: Sensors (Basel, Switzerland)

Issue: 16

ISSN: 1424-8220