Carrier-Free Dual-Comb Distance Metrology Using Two-Photon Detection (2021)

First Author: Wright H
Attributed to:  Frequency-comb enabled metrology for manufacturing funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/cleo/europe-eqec52157.2021.9541761

Publication URI: http://dx.doi.org/10.1109/cleo/europe-eqec52157.2021.9541761

Type: Conference/Paper/Proceeding/Abstract