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Probing Electrochemistry at the Nanoscale: In Situ TEM and STM Characterizations of Conducting Filaments in Memristive Devices

First Author: Yang Y

Attributed to: Structural dynamics of amorphous functional oxides - the role of morphology and electrical stress funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1007/978-3-030-42424-4_5

Publication URI: http://dx.doi.org/10.1007/978-3-030-42424-4_5

Type: Book Chapter

Book Title: Resistive Switching: Oxide Materials, Mechanisms, Devices and Operations (2022)

Page Reference: 87-120

ISSN: 1773-0155