Probing Electrochemistry at the Nanoscale: In Situ TEM and STM Characterizations of Conducting Filaments in Memristive Devices
Attributed to:
Structural dynamics of amorphous functional oxides - the role of morphology and electrical stress
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1007/978-3-030-42424-4_5
Publication URI: http://dx.doi.org/10.1007/978-3-030-42424-4_5
Type: Book Chapter
Book Title: Resistive Switching: Oxide Materials, Mechanisms, Devices and Operations (2022)
Page Reference: 87-120
ISSN: 1773-0155