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Standards for the Characterization of Endurance in Resistive Switching Devices. (2021)

First Author: Lanza M

Attributed to: Structural dynamics of amorphous functional oxides - the role of morphology and electrical stress funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/acsnano.1c06980

PubMed Identifier: 34730935

Publication URI: http://europepmc.org/abstract/MED/34730935

Type: Journal Article/Review

Volume: 15

Parent Publication: ACS nano

Issue: 11

ISSN: 1936-0851