Standards for the Characterization of Endurance in Resistive Switching Devices. (2021)
Attributed to:
Structural dynamics of amorphous functional oxides - the role of morphology and electrical stress
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1021/acsnano.1c06980
PubMed Identifier: 34730935
Publication URI: http://europepmc.org/abstract/MED/34730935
Type: Journal Article/Review
Volume: 15
Parent Publication: ACS nano
Issue: 11
ISSN: 1936-0851