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A nanoscale analysis method to reveal oxygen exchange between environment, oxide, and electrodes in ReRAM devices (2021)

First Author: Cox H

Attributed to: Structural dynamics of amorphous functional oxides - the role of morphology and electrical stress funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/5.0070046

Publication URI: http://dx.doi.org/10.1063/5.0070046

Type: Journal Article/Review

Parent Publication: APL Materials

Issue: 11