Dynamic measurements at up to 130-kHz sampling rates using Ti:sapphire dual-comb distance metrology (2021)
Attributed to:
Frequency-comb enabled metrology for manufacturing
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1364/oe.433871
Publication URI: http://dx.doi.org/10.1364/oe.433871
Type: Journal Article/Review
Parent Publication: Optics Express
Issue: 25