Simultaneous microscopic imaging of thickness and refractive index of thin layers by heterodyne interferometric reflectometry (HiRef) (2021)
Attributed to:
Cardiff University Experimental Equipment
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1361-6463/ac22d4
Publication URI: http://dx.doi.org/10.1088/1361-6463/ac22d4
Type: Journal Article/Review
Parent Publication: Journal of Physics D: Applied Physics
Issue: 5